Dmitry Boychenko, Oleg Kalashnikov, Aleksandr Nikiforov, Anastasija Ulanova, Dmitry Bobrovsky, Pavel Nekrasov

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Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional "simple" ICs. The main difficulty is to organize informative and quick functional test dirctly under irradiation. Functional tests approach specified for complex multifunctional VLSI devices is presented and the basic radiation test procedure is discussed in application to some typical examples.



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