NOVEL SINGLE LAYER FAULT TOLERANCE RCA CONSTRUCTION FOR QCA TECHNOLOGY

Zahra Taheri, Abdalhossein Rezai, Hamid Rashidi

DOI Number
https://doi.org/10.2298/FUEE1904601T
First page
601
Last page
613

Abstract


Quantum-dot Cellular Automata (QCA) technology has become a promising and accessible candidate that can be used for digital circuits implementation at Nanoscale, but the circuit design in the QCA technology has been limited due to fabrication high-defect rate. So, this issue is an interesting research topic in the QCA circuits design. In this study, a novel 3-input Fault Tolerance (FT) Majority Gate (MG) is developed. Accordingly, an efficient 1-bit QCA full adder is developed using the developed 3-input MG. Then, a new 4-bit FT QCA Ripple Carry Adder (RCA) is developed based on the proposed 1-bit FT QCA FA. The developed circuits are implemented in the QCADesigner tool version 2.0.3. The results indicate that the developed QCA circuits provide advantages compared to other QCA circuits in terms of double and single cell missing defect, area and delay time.


Keywords

Nanoelectronics, fault-tolerance, majority gate, QCA FA, ripple carry adder, quantum-dot cellular automata

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References


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