INFRARED THERMOGRAPHY APPLIED TO POWER ELECTRON DEVICES INVESTIGATION

Giovanni Breglio, Andrea Irace, Luca Maresca, Michele Riccio, Gianpaolo Romano, Paolo Spirito

DOI Number
-
First page
205
Last page
212

Abstract


The aim of this paper is to give a presentation of the principal applications of Infrared Thermography for analysis and testing of electron devices. Even though experimental characterization could be carried out on almost any electronic devices and circuits, here IR Thermography for investigation of power semiconductor devices is presented. Different examples of functional and failure analysis in both transient and lock-in modes will be reported.

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References


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