Nguyen, Hieu Pham Trung, Department of Electrical and Computer Engineering, New Jersey Institute of Technology, University Heights, Newark, NJ 07102, USA, United States
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Vol 34, No 3 (2021) - SPECIAL SECTION
CONTROLLED ELECTRON LEAKAGE IN ELECTRON BLOCKING LAYER FREE InGaN/GaN NANOWIRE LIGHT-EMITTING DIODES
Abstract PDF
ISSN: 0353-3670 (Print)
ISSN: 2217-5997 (Online)
COBISS.SR-ID 12826626