Pershenkov, Vyacheslav Sergeevich, Microelectronic Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Moscow, Russian Federation, Russian Federation

• Vol 29, No 4 (2016) - REGULAR PAPERS
  ELECTROMAGNETIC PULSE EFFECTS AND DAMAGE MECHANISM ON THE SEMICONDUCTOR ELECTRONICS
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626