Bensoussan, Alain, Institute of Technology Antoine de Saint Exupery, Toulouse, France, France

• Vol 30, No 1 (2017) - INVITED PAPERS
  MICROELECTRONIC RELIABILITY MODELS FOR MORE THAN MOORE NANOTECHNOLOGY PRODUCTS
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626