Bensoussan, Alain, Institute of Technology Antoine de Saint Exupery, Toulouse, France, France
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Vol 30, No 1 (2017) - INVITED PAPERS
MICROELECTRONIC RELIABILITY MODELS FOR MORE THAN MOORE NANOTECHNOLOGY PRODUCTS
Abstract PDF
ISSN: 0353-3670 (Print)
ISSN: 2217-5997 (Online)
COBISS.SR-ID 12826626