Artamonov, Alexey S., National Research Nuclear University MEPhI, Moscow, Russian Federation

• Vol 27, No 3 (2014) - INVITED PAPERS
  METHOD FOR INTEGRATED CIRCUITS TOTAL IONIZING DOSE HARDNESS TESTING BASED ON COMBINED GAMMA- AND X-RAY IRRADIATION FACILITIES
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626