Dankovic, Danijel, University of Nis, Faculty of Electronic Engineering, Serbia, Serbia

• Vol 30, No 4 (2017) - INVITED PAPERS
  CONSIDERATION OF CONDUCTION MECHANISMS IN HIGH-K DIELECTRIC STACKS AS A TOOL TO STUDY ELECTRICALLY ACTIVE DEFECTS
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626