Golubović, Snežana, University of Niš, Faculty of Electronic Engineering, Serbia

• Vol 31, No 3 (2018) - INVITED PAPERS
  NBT STRESS AND RADIATION RELATED DEGRADATION AND UNDERLYING MECHANISMS IN POWER VDMOSFETS
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626