STRUCTURAL DESIGN AND PERFORMANCE ANALYSIS OF DOUBLE GATE POCKET TFET FOR LOW POWER APPLICA-TIONS
Abstract
This research investigates Tunnel Field Effect Transistors (TFETs), a paradigm shift in low-power electronics, leveraging band-to-band tunneling for superior subthreshold slope and reduced power dissipation compared to conventional MOSFETs. We elucidate the underlying physics of TFET operation, analyzing the interplay between device geometry, material properties, and band structure engineering. A comprehensive analysis of key performance metrics, including on-current, off-current, and subthreshold swing, is conducted, considering the impact of critical device parameters. Furthermore, this work presents a novel vertical TFET architecture demonstrating enhanced performance and scalability compared to conventional planar devices. The vertical structure minimizes parasitic resistances and enables efficient band-to-band tunneling, leading to significant improvements in device characteristics. Challenges associated with both conventional and vertical TFETs, including material integration and performance limitations, are critically examined alongside potential mitigation strategies. The potential applications of TFETs are explored across diverse domains, including low-power digital circuits, RFICs, and neuromorphic computing, highlighting their significance in addressing the escalating demand for energy-efficient electronics in the era of AI and IoT. Finally, future research directions, emphasizing the need for interdisciplinary collaboration and innovative approaches to materials, device engineering, and circuit design, are outlined to unlock the full potential of TFETs in shaping the future of electronics.
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A. Garg, R. K. Ratnesh, R. K. Chauhan, N. Mittal and H. Shankar, "Current Advancement and Progress in BioFET: A Review", In Proceedings of the 2022 International Conference on Signal and Information Processing (IConSIP), Pune, India, 2022, pp. 1-7,
S. Hussain, N. Mustakim, S. Singha and J. K. Saha, "A Comprehensive Study on Tunneling Field Effect Transistor using Non-local Band-to-Band Tunneling Model", J. Phys.: Conf. Ser., vol. 1432, no. 1, p. 012028, 2020.
K. Baral, P. K. Singh, S. Kumar, A. Singh, M. Tripathy, S. Chander, and S. Jit, "2-D Analytical Modeling of Drain and Gate-Leakage Currents of Cylindrical Gate Asymmetric Halo Doped Dual Material-Junctionless Accumulation Mode MOSFET", AEU – Int. J. Electron. Commun., vol. 116, p. 153071, 2020.
U. E. Avci, D. H. Morris and I. S. Young, "Tunnel Field-Effect Transistors: Prospects and Chal-lenges", IEEE J. Electron Devices Soc., vol. 3, no. 3, pp. 88-95, 2015.
N. N. Reddy and D. K. Panda, "A Comprehensive Review on Tunnel Field-Effect Transistor (TFET) Based Biosensors: Recent Advances and Future Prospects on Device Structure and Sensi-tivity", Silicon, vol. 13, pp. 3085-3100, 2021.
K. Baral, P. K. Singh, S. Kumar, M. R. Tripathy, A. K. Singh, S. Chander, and S. Jit, "A 2-D Compact DC Model for Engineered Nanowire JAM-MOSFETs Valid for All Operating Regimes", Semicond. Sci. Technol., vol. 35, no. 8, p. 085014, 2020.
W. Y. Choi, B.-G. Park, J. D. Lee and T.-J. K. Liu, "Tunneling Field-Effect Transistors (TFETs) With Subthreshold Swing (SS) Less Than 60 mV/dec", IEEE Electron Device Lett., vol. 28, no. 8, pp. 743-745, 2007.
Z.-F. Han, G.-P. Ru and G. Ruan, "A Simulation Study of Vertical Tunnel Field Effect Transis-tors", In Proceedings of the 9th IEEE International Conference on ASIC, Xiamen, China, 2011, pp. 665-668.
N. N. Reddy and D. K. Panda, "A Comprehensive Review on Tunnel Field-Effect Transistor (TFET) Based Biosensors: Recent Advances and Future Prospects on Device Structure and Sensi-tivity", Silicon, vol. 13, pp. 3085-3100, 2021.
A. K. Singh, M. R. Tripathy, K. Baral and S. Jit, "GaSb/GaAs Type-II Heterojunction TFET on SELBOX Substrate for Dielectric Modulated Label-Free Biosensing Application", IEEE Trans. Electron Devices, vol. 69, no. 9, pp. 5185-5192, 2022.
A. Sharon Geege and T. S. Arun Samuel, "Vertically-Grown TFETs: An Extensive Analysis", Silicon, vol. 15, no. 9, pp. 3783-3796, 2022.
A. M. Jossy and T. Vigneswaran, "A Perspective Review of Tunnel Field Effect Transistor With Steeper Switching Behavior and Low Off Current (IOFF) For Ultra Low Power Applications". Int. J. Eng. Technol., vol. 6, no. 5, pp. 2092-2104, 2014.
M. R. Tripathy, A. K. Singh, K. Baral, P. K. Singh and S. Jit, "III-V/Si Staggered Heterojunction Based Source-Pocket Engineered Vertical TFETs for Low Power Applications", Superlattices Mi-crostruct., vol. 142, p. 106494, 2020.
D. Barah, A. K. Singh, B. Bhowmick, "TFET on Selective Buried Oxide (SELBOX) Substrate with Improved ION/IOFF Ratio and Reduced Ambipolar Current". Silicon, vol. 11, no. 2, pp. 973-981, 2018.
S. Singh and B. Raj, "Vertical Tunnel-FET Analysis for Excessive Low Power Digital Applica-tions", In Proceedings of the First International Conference on Secure Cyber Computing and Communication (ICSCCC), Jalandhar, India, 2018, pp. 192-197.
U. E. Avci, D. H. Morris and I. S. Young, "Tunnel Field-Effect Transistors: Prospects and Chal-lenges", IEEE J. Electron Devices Soc., vol. 3, no. 3, pp. 88-95, 2015.
P. Kumar Kumawat, S. Birla, N. Singh, "Tunnel Field Effect Transistor Device Structures: A Comprehensive Review", Mater. Today, vol. 79, no. 2, pp. 292-296, 2022.
S. Datta, H. Liu and V. Narayanan, "Tunnel FET Technology: A Reliability Perspective", Microe-lectron. Reliab., vol. 54, no. 5, pp. 861-874, 2014.
T. Nirschl, S. Henzler, C. Pacha, P.-F. Wang, W. Hansch, G. Georgakos and D. Schmitt-Landsiedel, "The Tunneling Field Effect Transistor (TFET) Used in a Single-Event-Upset (SEU) Insensitive 6 Transistor SRAM Cell in Ultra-Low Voltage Applications", In Proceedings of the 4th IEEE Conference on Nanotechnology, Munich, Germany, 2004, pp. 402-404.
M. R. Tripathy, A. Samad, A. K. Singh, P. K. Singh, K. Baral, A. K. Mishra and S. Jit, "Impact of Interface Trap Charges on Electrical Performance Characteristics of a Source Pocket Engineered Ge/Si Heterojunction Vertical TFET with HfO2/Al2O3 Laterally Stacked Gate Oxide", Microelec-tron. Reliab., vol. 119, p. 114073, 2021.
M. R. Tripathy, A. K. Singh, K. Baral, P. K. Singh, A. K. Mishra, D. K. Jarwal and S. Jit, "Study of Temperature Sensitivity on Linearity Figures of Merit of Ge/Si Hetero-Junction Gate-Drain Underlapped Vertical Tunnel FET with Heterogeneous Gate Dielectric Structure for Improving Device Reliability", In Proceedings of URSI Regional Conference on Radio Science (URSI-RCRS), Varanasi, India, 2020, pp. 1-4.
S. Singh and B. Raj, "Analytical Modelling and Simulation of Si-Ge Hetero-Junction Dual Material Gate Vertical T-Shaped Tunnel FET", Silicon, vol. 13, pp. 1139-1150, 2020.
A. K. Singh, M. R. Tripathy, K. Baral and S. Jit "Design and Performance Assessment of HfO2/SiO2 Gate Stacked Ge/Si Heterojunction TFET on SELBOX Substrate (GSHJ-STFET)", Sil-icon, vol. 14, pp. 11847-11858, 2022.
A. K. Singh, M. R. Tripathy, K. Baral, P. K. Singh and S. Jit, "Ferroelectric Gate Heterojunction TFET on Selective Buried Oxide (SELBOX) Substrate for Distortionless and Low Power Applica-tions", In Proceedings of the 4th IEEE Electron Devices Technology & Manufacturing Confer-ence (EDTM), Penang, Malaysia, 2020, pp. 1-4.
D. Kumar, R. G. Mishra, R. Mishra and A. K. Shrivastava, "Impact of Band to Band Tunneling on Transient Performance of Dual Gate Tunnel Field Effect Transistor (TFET)", Int. J. Innov. Tech-nol. Exploring Eng., vol. 8, no. 9, pp. 284-288, 2019.
M. K. Yadav, S. K. Gupta, S. Rai and A. C. Pandey, "Al Embedded MgO Barrier MTJ: A First Principle Study for Application in Fast and Compact STT-MRAMs", Superlattices and Micro-struct., vol. 103, 314-324, 2017.
M. K. Yadav and S. K. Gupta, "FeAl/MgO/FeAl MTJ with Enhanced TMR and Low Resistance Area Product for MRAM: A First Principle Study", Micro and Nanostructures, vol. 165, pp. 207192-207192, 2022.
M. R. Tripathy, A. K. Singh, S. Chander, K. P. Singh and S. Jit, "Device-Level Performance Com-parison of Some Pocket Engineered III-V/Si Hetero-Junction Vertical Tunnel Field Effect Transis-tor", In Proceedings of the 5th International Conference on Devices, Circuits and Systems (ICDCS), Coimbatore, India, 2020, pp. 180-183.
D. Madadi and S. Mohammadi, "Switching Performance Assessment of Gate-All-Around InAs–Si Vertical TFET with Triple Metal Gate, a Simulation Study". Nanoscale Res. Lett., vol. 18, p. 37, 2023.
B. Ma, S. Chen, S. Wang, T. Han, H. Zhang, C. Yin, Y. Chen and H. Liu, "A Novel L-Gate In-GaAs/GaAsSb TFET with Improved Performance and Suppressed Ambipolar Effect". Microm-achines, vol. 13, no. (9), p. 1474, 2022.
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