FIBER OPTICS ENGINEERING: PHYSICAL DESIGN FOR RELIABILITY

Ephraim Suhir

DOI Number
-
First page
153
Last page
182

Abstract


The review part of the paper addresses analytical modeling in fiber optics engineering. Attributes and significance of predictive modeling are indicated and discussed. The review is based mostly on the author’s research conducted at Bell Laboratories, Physical Sciences and Engineering Research Division, Murray Hill, NJ, USA, during his tenure with Bell Labs for about twenty years, and, to a lesser extent, on his recent work in the field. The addressed topics include, but are not limited to, the following major fields: bare fibers; jacketed and dual-coated fibers; coated fibers experiencing thermal and/or mechanical loading; fibers soldered into ferrules or adhesively bonded into capillaries; roles of geometric and material non-linearity; dynamic response to shocks and vibrations; as well as possible applications of nano-materials in new generations of coating and cladding systems.

The extension part is concerned with a new, fruitful and challenging direction in optical engineering- probabilistic design for reliability (PDfR) of opto-electronic and photonic systems, including fiber optics engineering. The rationale behind the PDfR concept is that the difference between a highly reliable optical fiber system and an insufficiently reliable one is “merely” in the level of the never-zero probability of failure. It is the author’s belief that when the operational reliability of an optical fiber system and product is imperative, the ability to predict, quantify, assure and, if possible and appropriate, even specify this reliability is highly desirable.

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References


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E. Suhir,“Linear Response to Shocks and Vibrations”, in E. Suhir, D.Steinberg and T.Yu, “Structural Dynamics of Electronic and Photonic Systems”, John Wiley, Hoboken, NJ., 2011.

E. Suhir, “Linear and Nonlinear Vibrations Caused by Periodic Impulses”. in E.Suhir, D.Steinberg and T.Yu, “Structural Dynamics of Electronic and Photonic Systems”, John Wiley, Hoboken, NJ., 2011.

E. Suhir, “Random Vibrations of Structural Elements in Electronic and Photonic Systems”, in E.Suhir, D.Steinberg and T.Yu, “Structural Dynamics of Electronic and Photonic Systems”, John Wiley, Hoboken, NJ., 2011.

C.Y. Zhou, T.X. Yu, S.W. Ricky Lee and E. Suhir, “Shock Test Methods and Test Standards for Portable Electronic Devices”, in E. Suhir, D. Steinberg and T. Yu, “Structural Dynamics of Electronic and Photonic Systems”, John Wiley, Hoboken, NJ., 2011.

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E. Suhir, “Predictive Modeling of the Dynamic Response of Electronic Systems to Shocks and Vibrations”, ASME Appl. Mech. Reviews, vol. 63, No.5, March, 2011.

E. Suhir, “Structural Dynamics of Electronics Systems”, Modern Physics Letters B (MPLB), Vol. 27, No. 7, March 2013.

E. Suhir, and D. Ingman, “New Hermetic Coating for Optical Fiber Dramatically Improves Strength: New Nano-Particle Material (NPM) and NPM-Based New Generation of Optical Fiber Claddings and Coating”, US Navy Workshop, St. Louis, MO, 2003: Could Nano-Technology Make a Difference?”, Polytronic’04, Portland, OR, September 13-15, 2001.

E. Suhir, “Polymer Coated Optical Glass Fiber Reliability: Could Nano-Technology Make a Difference?”, Polytronic’04, Portland, OR, September 13-15, 2004.

E. Suhir, “New Nano-Particle Material (NPM) for Micro- and Opto-Electronic Packaging Applications”, IEEE Workshop on Advanced Packaging Materials, Irvine, March 2005.

D. Ingman and E. Suhir, “Optical Fiber with Nano-Particle Overclad”, US Patent, #7,162,138 B2, 2007.

D. Ingman and E. Suhir, “Optical Fiber with Nano-Particle Cladding”, US Patent, #7,162,137 B2, 2007.

E. Suhir, “Fiber-Optics Structural Mechanics and Nano-Technology Based New Generation of Fiber Coatings: Review and Extension”, in E. Suhir, CP Wong, YC Lee, eds. “Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Packaging, Reliability”, Springer, 2007.

E. Suhir, D. Ingman, “Highly Compliant Bonding Material and Structure for Micro- and Opto-Electronic Applications”, in E. Suhir, CP Wong, YC Lee, eds. “Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Packaging, Reliability”, Springer, 2007.

T. Mirer, ,D. Ingman, E. Suhir, “Reliability Improvement Through Nano-Particle-Material-Based Fiber Structures”, Optical Fiber Technology, v. 13, 2007.

E. Suhir, “Polymer Coating of Optical Silica Fibers, and a Nanomaterial-Based Coating System”, Keynote Presentation, Polytronic’2007, Proceedings of the International Conference on Polymeric Materials for Micro- and Opto-Electronics Applications, Tokyo, Japan, January 14-16, 2007.

D. Ingman , V. Ogenko, E. Suhir, A. Glista, “Moisture Resistant Nano-Particle Material and Its Applications”, US Patent #7,321,714B2, 2008.

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E. Suhir, “Predicted Stresses and Strains in Fused Bi-Conical Taper Couplers Subjected to Tension”, Applied Optics, vol. 32, No. 18, 1993.

E. Suhir, and J.J. Vuillamin, Jr., "Effects of the CTE and Young's Modulus Lateral Gradients on the Bowing of an Optical Fiber: Analytical and Finite Element Modeling", Optical Engineering, vol. 39, No. 12, 2000.

E. Suhir, “Apparatus and Method for Thermostatic Compensation of Temperature Sensitive Devices”, US Patent #6,337,932, 2002.

E. Suhir, R. Mahajan, “Are Current Qualification Practices Adequate?“, Circuit Assembly, April 2011

E. Suhir,”Accelerated Life Testing (ALT) in Microelectronics and Photonics: Its Role, Attributes, Challenges, Pitfalls, and Interaction With Qualification Tests”, ASME J. Electr. Packaging (JEP), Vol. 124, No. 3, 2002.

E. Suhir, “Failure-Oriented-Accelerated-Testing (FOAT) and Its Role in Making a Viable IC Package into a Reliable Product”, Circuits Assembly, July 2013.

E. Suhir, A. Bensoussan, J. Nicolics, L. Bechou, “Highly Accelerated Life Testing (HALT), Failure Oriented Accelerated Testing (FOAT), and Their Role in Making a Viable Device into a Reliable Product”, 2014 IEEE Aerospace Conference, Big Sky, Montana, March 2014.

E. Suhir, “Failure-Oriented-Accelerated-Testing (FOAT) and Its Role in Making a Viable Package into a Reliable Product”, SEMI-TERM 2014, San Jose, CA, March 9-13, 2014.

E. Suhir, “How to Make a Photonic Device Into a Product: Role of Accelerated Life Testing”, Keynote Address at the International Conference of Business Aspects of Microelectronic Industry, Hong-Kong, January 2003.

E. Suhir,“Reliability and Accelerated Life Testing”, Semiconductor International, February 1, 2005.

E. Suhir,“When Reliability is Imperative, Ability to Quantify It is a Must”, IMAPS Advanced Microelectronics, August 2012.

E. Suhir, "Applied Probability for Engineering and Scientists", McGraw Hill, New York, 1997.

E. Suhir, “Thermal Stress Modeling in Microelectronics and Photonics Packaging, and the Application of the Probabilistic Approach: Review and Extension”, IMAPS Int. J. of Microcircuits and Electronic Packaging, vol.23, No.2, 2000 (invited).

E. Suhir, “Probabilistic Design for Reliability”, ChipScale Reviews, vol.14, No.6, 2010.

E. Suhir, “Remaining Useful Lifetime (RUL): Probabilistic Predictive Model”, Int. J. of PHM, vol 2(2), 2011.

E. Suhir, R. Mahajan, A. Lucero, L. Bechou, “Probabilistic Design for Reliability (PDfR) and a Novel Approach to Qualification Testing (QT)”, 2012 IEEE/AIAA Aerospace Conf., Big Sky, Montana, 2012

E. Suhir, “How Long Could/Should be the Repair Time for High Availability?”, Modern Physics Letters B (MPLB), vol.27, Aug.30, 2013.

E. Suhir, “Could Electronics Reliability Be Predicted, Quantified and Assured?” Microelectronics Reliability, No. 53, April 15, 2013.

E. Suhir, “Boltzmann-Arrhenius-Zhurkov (BAZ) Model in Physics-of-Materials Problems”, Modern Physics Letters B (MPLB), vol.27, April 2013.

E. Suhir, L. Bechou, “Availability Index and Minimized Reliability Cost”, Circuit Assemblies, February 2013.

A. Bensoussan, and E. Suhir, “Design-for-Reliability (DfR) of Aerospace Electronics: Attributes and Challenges", 2013 IEEE Aerospace Conference, Big Sky, Montana, March 2013.

E. Suhir, “Assuring Aerospace Electronics and Photonics Reliability: What Could and Should Be Done Differently”, 2013 IEEE Aerospace Conference, Big Sky, Montana, March 2013.

E. Suhir, “Predicted Reliability of Aerospace Electronics: Application of Two Advanced Probabilistic Techniques”, 2013 IEEE Aerospace Conference, Big Sky, Montana, March 2013.

E. Suhir, A. Bensoussan, “Application of Multi-parametric BAZ Model in Aerospace Optoelectronics”, 2014 IEEE Aerospace Conference, Big Sky, Montana, March 2014.

E. Suhir, “Combined Statistics- and Physics-of-Failure- Based Approach in the Probabilistic Design for Reliability of Opto-Electronics Products”, Optical Engineering, 2014.


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