Artamonov, Alexey S., National Research Nuclear University MEPhI, Moscow, Russian Federation
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Vol 27, No 3 (2014) - INVITED PAPERS
METHOD FOR INTEGRATED CIRCUITS TOTAL IONIZING DOSE HARDNESS TESTING BASED ON COMBINED GAMMA- AND X-RAY IRRADIATION FACILITIES
Abstract PDF
ISSN: 0353-3670 (Print)
ISSN: 2217-5997 (Online)
COBISS.SR-ID 12826626