Sharma, Bikash, Sikkim Manipal Institute of Technology, Sikkim, India, India

• Vol 35, No 1 (2022) - SPECIAL SECTION
  FIRST PRINCIPLE INSIGHT INTO Co-DOPED MoS2 FOR SENSING NH3 AND CH4
  Abstract  PDF
• Vol 36, No 4 (2023) - REGULAR PAPERS
  IMPACT OF HIGH-Κ METAL OXIDE AS GATE DIELECTRIC ON THE CERTAIN ELECTRICAL PROPERTIES OF SILICON NANOWIRE FIELD-EFFECT TRANSISTORS: A SIMULATION STUDY
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626