Pantić, Dragan, Faculty of Electronic Engineering, University of Niš, Niš, Serbia, Serbia

• Vol 31, No 2 (2018) - REGULAR PAPERS
  THE SURFACE RECOMBINATION VELOCITY AND BULK LIFETIME INFLUENCES ON PHOTOGENERATED EXCESS CARRIER DENSITY AND TEMPERATURE DISTRIBUTIONS IN N-TYPE SILICON
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626