Shrimali, Hitesh, INFN-Milano and Department of Physics, Università degli Studi di Milano Via G. Celoria, 16 – 20133 Milano, Italy, Italy

• Vol 27, No 2 (2014) - INVITED PAPERS
  CMOS IC RADIATION HARDENING BY DESIGN
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626