Hájek, Jiri, Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Czech Republic

• Vol 28, No 3 (2015) - REGULAR PAPERS
  CAPACITIVE METHODS FOR TESTING OF POWER SEMICONDUCTOR DEVICES
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626