Rout, Prakash Kumar, Department of Electronics and Instrumentation Engineering, Silicon Institute of Technology, Bhubaneswar, India, India

• Vol 35, No 1 (2022) - SPECIAL SECTION
  INFLUENCE OF OXIDE THICKNESS VARIATION ON ANALOG AND RF PERFORMANCES OF SOI FINFET
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626