Sahu, Prasanna, National Institute of Technology, Rourkela., India

• Vol 27, No 4 (2014) - REGULAR PAPERS
  RESOLVING THE BIAS POINT FOR WIDE RANGE OF TEMPERATURE APPLICATIONS IN HIGH-K/METAL GATE NANOSCALE DG-MOSFET
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626