Velpula, Ravi Teja, Department of Electrical & Computer Engineering New Jersey Institute of Technology Newark, NJ, 07102, USA, United States

• Vol 34, No 3 (2021) - SPECIAL SECTION
  CONTROLLED ELECTRON LEAKAGE IN ELECTRON BLOCKING LAYER FREE InGaN/GaN NANOWIRE LIGHT-EMITTING DIODES
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626