Golubović, Snežana, University of Niš, Faculty of Electronic Engineering, Niš, Serbia, Serbia

• Vol 29, No 1 (2016) - INVITED PAPERS
  EFFECTS OF PULSED NEGATIVE BIAS TEMPERATURE STRESSING IN P-CHANNEL POWER VDMOSFETS
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626