Golubović, Snežana, University of Niš, Faculty of Electronic Engineering, Serbia
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Vol 31, No 3 (2018) - INVITED PAPERS
NBT STRESS AND RADIATION RELATED DEGRADATION AND UNDERLYING MECHANISMS IN POWER VDMOSFETS
Abstract PDF
ISSN: 0353-3670 (Print)
ISSN: 2217-5997 (Online)
COBISS.SR-ID 12826626