Davidović, Vojkan, Faculty of Electronic Engineering, University of Niš, Serbia

• Vol 37, No 4 (2024) - SPECIAL SECTION
  SUCCESSIVE IRRADIATION AND BIAS TEMPERATURE STRESS INDUCED EFFECTS ON COMMERCIAL P-CHANNEL POWER VDMOS TRANSISTORS
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626