Wimmer, Yannick, Institute for Microelectronics, TU Wien, Gusshausstrae 27-29, A-1040 Vienna, Austria

• Vol 27, No 4 (2014) - INVITED PAPERS
  MODELING OF HOT-CARRIER DEGRADATION BASED ON THOROUGH CARRIER TRANSPORT TREATMENT
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626