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Castrejon-Martinez, Christian, CIICAp and the Faculty of Sciences on Chemistry and Engineering, Autonomous University of State Morelos (UAEM), Av. Universidad 1001, 62209 Cuernavaca, Mor., (Mexico)
Cerdeira, Antonio, SEES, Depto. de Ingeniería Eléctrica, CINVESTAV-IPN, Av. IPN 2208, CP 07360, México City, México. (Mexico)
Cerdeira, Antonio, Cinvestav, Mexico City (Mexico)
Ceric, Hajdin, Christian Doppler Laboratory for Reliability Issues in Microelectronics at the Institute for Microelectronics, TU Wien, Austria Institute for Microelectronics, TU Wien, Gußhausstraße 27–29, A-1040 Wien, Austria (Austria)
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Chakraborty, Soma, Department of Electronics and Communication Engineering, Indian Institute of Information Technology, Nagpur, Maharashtra-441108 (India)
Chakraborty, Soumik, NIT Silchar (India)
Chedjara, Zakaria, Laboratory AVCIS, University of Mohamed Boudiaf, Oran, Algeria
Chen, Xiangjie, Institute of Photonics and Microelectronics, School of Information Sciences and Electronic Engineering, Zhejiang University, Hangzhou, CHINA (China)
Chettri, Bibek, Sikkim Manipal Institute of Technology, Sikkim, India (India)
Chettri, Bibek, Department of Physics, Sikkim Manipal Institute of Technology, Majitar, Sikkim, India (India)
Chettri, Pronita, Department of Physics, Sikkim Manipal Institute of Technology, Majitar, Sikkim, India (India)
Chettri, Pronita, Sikkim Manipal Institute of Technology, Sikkim, India (India)
Chibani, Abdelilah, University of Tiaret, Electrical Engineering and Plasmas Laboratory, (LGEP), Algeria (Algeria)
Chouhan, Sanjay, JIT, Borawan , India (India)
Chukov, George, National Research Nuclear University MEPhI (NRNU MEPhI), Moscow, Russian Federation (Russian Federation)
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Ciota, Zygmunt, Lodz University of Technology, Department of Microelectronics and Computer Science, ul. Wolczanska 221/223, 90-924 Lodz
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Ćirić, Dejan, University of Niš, Faculty of Electronic Engineering in Niš, Niš, Serbia (Serbia)
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Ciric, Tomislav, University of Nis, Faculty of Electronic Engineering, Nis, Serbia (Serbia)
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ISSN: 0353-3670 (Print)
ISSN: 2217-5997 (Online)
COBISS.SR-ID 12826626