OSCILLATION-BASED TESTING METHOD FOR DETECTING SWITCH FAULTS IN HIGH-Q SC BIQUAD FILTERS

Miljana Milic, Vančo Litovski

DOI Number
-
First page
223
Last page
236

Abstract


Testing switched capacitor circuits is a challenge due to the diversity of the possible faults. A special problem encountered is the synthesis of the test signal that will control and will make the fault-effect observable at the test point. The oscillation based method which was adopted for testing in these proceedings resolves that important issue by his nature. Here we discuss the properties of the method and the conditions to be fulfilled in order to implement it in the right way. To achieve that we resolved the problem of synthesis of the positive feed-back circuit and the choice of a proper model of the operational amplifier. In that way a realistic foundation to the testing process was generated. A second order notch cell was chosen as a case-study. Fault dictionaries were developed related to the catastrophic faults of the switches used within the cell. The results reported here are a continuation of our previous work and are complimentary to some other already published.

Full Text:

PDF

References


Arabi, K., and Kaminska, B., “Oscillation-test strategy for analog and mixed-signal integrated circuits”. Proc. of the 14th IEEE VLSI Test Symposium (VTS’96), Princeton, New Jersey, April/may 1996, pp. 476-482.

Arabi, K., and Kaminska, B., “Efficient and accurate testing of analog-to-digital converters using oscilation-test method” Proc. of the European Design and Test Conference (ED&TC 97), Paris, France, March 1997, pp. 384-352.

Arabi, K., and Kaminska, B., “Oscilation-test methodology for low-cost testing of active filters”, IEEE Trans. on Instrumentation and Measurements, Vol. 48, No. 4, August 1999, pp 798-806.

Milić, M., Andrejević Stošović, M., and Litovski, V., "Oscillation based analog testing – a case study", In Proc. of the 34th Int. Conf. on Information and Communication Technology, Electronics and Microelectronics MIPRO 2011, Opatija, Croatia, 2011, vol. 1, pp. 118-123.

Andrejević Stošović, M., Milić, M., and Litovski, V., „Analog filter diagnosis using the oscillation based method“, Journal of Electrical Engineering, ISSN 1335-3632, Vol. 63, No. 6, 2012, pp. 349–356.

Andrejević Stošović, M., Milić, M., Zwolinski, M., Litovski, V.,”Oscillation-based analog diagnosis using artificial neural networks based inference mechanism”, COMPELECENG-D-11-00818R3, Computers and Electrical Engineering, Vol. 39, 2013, pp. 190-201.

Chaehoi, A., Bertrand, Y., Latorre, L., and Nouet, P., “Improving the Efficiency of the Oscillation-based Test Methodology for Parametric Faults”, LATW'03, 4th IEEE Latin American Test Workshop, Natal, Brazil, 2003.

Raghunatan, A., Shin, H., and Abraham, J. A., “Prediction of analog performance parameters using oscillation based test”, Proc. 22nd IEEE VLSI Test Symp., Apr. 2004, pp. 377-382.

Raghunatan, A., Chun, J.H. Abraham, J. A., and Chatterjee, A. “Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters”, Proc. of the ITC'04, International Test Conference 2004, pp. 252-261.

Suenaga, K., Isern, E., Picos, R., Bota, S., Roca, M., and García-Moreno, E. “Application of Predictive Oscillation-Based Test to a CMOS OpAmp”, IEEE Transactions on Instrumentation and Measurement 09/2010;

Romero, E., Costamagna, M., Peretti, G., and Marques, C., “A performance Evaluation of Oscillation Based Test in Continuous Time Filters”, International Journal of Mechanical, Industrial Science and Engineerin Vol. 8, No. 1, 2014, pp 196-201.

Sankari.M.S and SathishKumar, P., "Oscillation Test Methodology for Built-In Analog Circuits ", International Journal Of Computational Engineering Research, IJCER, 2012, Vol. 2, Issue No.3, pp. 868-877]

Zarnik, M.S., Novak, F., Macek, S., "Design of oscillation-based test structures of active RC filters. IEE Proceedings, Circuits, Devices and Systems, 2000, Vol. 147, No. 5, pp. 297–302.

WANG, M.W.T, On the issues of oscillation test methodology. IEEE Transactions on Instrumentation and Measurement, 2000, Vol. 49, No. 2, pp. 240–245.

Hurst, S., "VLSI Testing: Digital and Mixed Analogue/Digital Techniques", Institution of Engineering and Technology (IET), UK, 1999.

Zarnik, M.S., Novak, F., Macek, S., "Efficient go No-Go test of active RC filters. In: International Journalof Circuit Theory and Applications, 1998, Vol. 26, No. 5, pp. 523–529.

Kač, U, and Novak, F., "All-pass SC biquad reconfiguration scheme for oscillation based analog BIST", Proc. of the 9th European Test Symposium, Ajaccio, France, 2004, pp. 133-138.

Kač, U., and Novak, F., "Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration", Journal of Electron. Test, vol. 23, no. 6, pp. 485-495, 2007.

Kač, U., and Novak, F., “Reconfiguration Schemes of SC Biquad Filters for Oscillation Based Test,” Information Technology and Control, vol.42, no. 1, pp. 38-47, 2013.

Huertas, G., Vazquez, D., Peralias, E. J., Rueda, A., and Huertas, H.L., "Practical Oscillation-Based Test of Integrated Filters", IEEE Design & Test of Computers, Vol. 19, No. 6, 2002, pp. 64-72.

K.Martin, A. Sedra, “Effect of the OPamp Finite Gain & Bandwidth on the Performance of Switched-Capacitor Filters," IEEE Trans. Circuits Syst., vol. CAS-28, no. 8, pp. 822-829, Aug 1981.

Náhlík, J.,, Hospodka, J., Sovka, P., and Pšenička,B., "Implementation Of A Two-Channel Maximally Decimated Filter Bank Using Switched Capacitor Circuits",Radioengineering, Vol. 22, No. 1, April 2013, pp. 167-173.

Robson, M., and Russell, G., "A digital method for testing embedded switched capacitor filters", In Proceedings of the conference on European design automation, EURO – DAC ‘96/ EURO – VHDL ’96, pp. 239–244.

Milić, M., and Litovski, V., "Soft defects testing in Notch SC filters using the oscillation method", In Proc. of the LVII ETRAN Conf., Zlatibor, Serbia, 2013, pp. EL 2.3.

Milić, M., and Litovski, V., "Testing Capacitors’ Hard Defects in Notch SC Filters Using the Oscillation Method", In Proc. of the 5th Small System Simulation Symposium, SSSS 2014, Niš, Serbia, pp. 30-36.

Allen, P. E., and Holberg, D. R., CMOS Analog Circuit Design, 2nd ed., Oxford University Press, New York, USA:, 2002.

Ironns, F.H., "Active filters for integrated circuits applications", Artech House, Norwood, MA, USA, 2005.

-, LT Spice User Manual, http://www.intactaudio.com/forum/viewtopic.php?t=596.

Chalk, C., Zwolinski, M. and Wilkins, B.R. "Test Stimulus Generation for Steady-State Analysis of Analogue and Mixed-signal Circuits", Proc. of the 3rd IEEE International Mixed Signal Testing Workshop,1997, pp. 85-92.

Kabisatpathy, P., Barua, A., ad Sinha, S., "Fault diagnosis of analog integrated circuits", Springer, Dordrecht, The Nederlands, 2005.

Mosin, S., "A built-in self-test circuitry based on reconfiguration for analog and mixed-signal IC." Information Technology and Control, 2011, Vol. 40, No. 3, pp. 260-264.

Hu, G., Wang, H., Hu, M., and Yang, S., "Oscillation test strategy for analog filters by monitoring output voltage and supply current," Thinghua Science and technology, Vol. 12, No. SI, July 2007, pp. 78-82.

Kaminska, B., "Analog and mixed signal test", in: Scheffer, L., Lavagno, L, and Martin, G., "EDA for IC system deisgn, verification, and testing ", CRC Press, Taylor&Francis Group, London, 2006.

Litovski, V., Zwolinski, M., "VLSI Circuit Simulation And Optimization", Chapman and Hall, London, 1997.

-, Linear tehnology, http://www.linear.com/designtools/software/?gclid=CK_dzsaKnL4CFQbMtAod2AkARg#LTspice


Refbacks

  • There are currently no refbacks.


ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626