THEMATIC ISSUE ON FAILURE MECHANISMS IN MICROELECTRONIC DEVICES

Abstract

Throughout the years, our knowledge of the root cause and physical behavior of critical failure mechanisms in microelectronic devices has grown significantly. However, the mechanisms that fully explain various experimental data have not yet been thoroughly elucidated and remain the subject of investigation. Findings and discussions of the thematic issue Facta Universitatis, Series Electronics and Energetics "Failure Mechanisms in Microelectronics Devices" should improve the research potential in the academic and industry environments in this area. Four papers are published offering interesting and valuable scientific results.