Tanaka, Kenichi, Research Institute for Nanodevices Hiroshima University, 1-4-2 Kagamiyama, Higashi-Hiroshima, 739-8527, Japan, Japan

• Vol 37, No 4 (2024) - SPECIAL SECTION
  IMPACT OF INTERFACE OXIDE TYPE ON THE GAMMA RADIATION RESPONSE OF SIC TTL ICS
  Abstract  PDF

ISSN: 0353-3670 (Print)

ISSN: 2217-5997 (Online)

COBISS.SR-ID 12826626