Vol 28, No 3 (2015)

Table of Contents

INVITED PAPERS

TWO CONTROL-FLOW ERROR RECOVERY METHODS FOR MULTITHREADED PROGRAMS RUNNING ON MULTI-CORE PROCESSORS
Navid Khoshavi, Hamid Reza Zarandi, Mohammad Maghsoudloo
PDF
309-323
THERMAL AND ELECTRO-THERMAL MODELING OF COMPONENTS AND SYSTEMS: A REVIEW OF THE RESEARCH AT THE UNIVERSITY OF PARMA
Roberto Menozzi, Paolo Cova, Nicola Delmonte, Francesco Giuliani, Giovanna Sozzi
PDF
325-344
RF MEMS/NEMS RESONATORS FOR WIRELESS COMMUNICATION SYSTEMS AND ADSORPTION-DESORPTION PHASE NOISE
Ivana Jokić, Miloš Frantlović, Zoran Đurić, Miroslav L. Dukić
PDF
345-381
OPTIMIZATION AND ADVANTAGES OF THE BIMODE INSULATED GATE TRANSISTOR
Munaf Rahimo, Liutauras Storasta
PDF
383-391
ZTC BIAS POINT OF ADVANCED FIN BASED DEVICE: THE IMPORTANCE AND EXPLORATION
Sushanta K Mohapatra, Kumar P. Pradhan, Prasanna K. Sahu
PDF
393-405

REGULAR PAPERS

SMARTER POWER METERS REDUCE ECONOMIC LOSSES AT UTILITY
Dejan S Stevanović, Predrag M Petković
PDF
407-421
INVESTIGATION OF THE EFFECT OF ADDITIONAL ELECTRONS ORIGINATING FROM THE ULTRAVIOLET RADIATION ON THE NITROGEN MEMORY EFFECT
Emilija Živanović
PDF
423-437
AN ARCHITECTURE FOR PERVASIVE HEALTHCARE SYSTEM BASED ON THE IMS AND BSN
Vanja Mišković, Djordje Babic
PDF
439-456
USING A TWO-CONTACT CIRCULAR TEST STRUCTURE TO DETERMINE THE SPECIFIC CONTACT RESISTIVITY OF CONTACTS TO BULK SEMICONDUCTORS
Aaron M. Collins, Yue Pan, Anthony S. Holland
PDF
457-464
MTJ-BASED HYBRID STORAGE CELLS FOR “NORMALLY-OFF AND INSTANT-ON” COMPUTING
Bojan Jovanovic, Raphael M. Brum, Lionel Torres
PDF
465-476
DEVELOPMENT OF LOW-VOLTAGE POWER MOSFET BASED ON APPLICATION REQUIREMENT ANALYSIS
Ralf Siemieniec, Michael Hutzler, Oliver Blank, David Laforet, Li Juin Yip, Alan Huang, Ralf Walter
PDF
477-494
CAPACITIVE METHODS FOR TESTING OF POWER SEMICONDUCTOR DEVICES
Vaclav Papež, Jiri Hájek, Bedrich Kojecký
PDF
495-505